| 1 | Upsorn Praphamontripong and Jeff Offutt and Lin Deng and Jingjing Gu
An Experimental Evaluation of Web Mutation Operators
Ninth {IEEE} International Conference on Software Testing, Verification and Validation Workshops, {ICST} Workshops 2016, Chicago, IL, USA, April 11-15, 2016, 2016. |
|
| | Abstract: Available soon... |
| | @INPROCEEDINGS{Praphamontripong16,
author = {Upsorn Praphamontripong and Jeff Offutt and Lin Deng and Jingjing Gu},
title = {An Experimental Evaluation of Web Mutation Operators},
booktitle = {Ninth {IEEE} International Conference on Software Testing, Verification and Validation Workshops, {ICST} Workshops 2016, Chicago, IL, USA, April 11-15, 2016},
year = {2016},
address = {},
month = {},
pages = {102--111}
} |
| 2 | Upsorn Praphamontripong and Jeff Offutt
Applying Mutation Testing to Web Applications
Third International Conference on Software Testing, Verification and Validation, {ICST} 2010, Paris, France, April 7-9, 2010, Workshops Proceedings, 2010. |
|
| | Abstract: Available soon... |
| | @INPROCEEDINGS{PraphamontripongO10,
author = {Upsorn Praphamontripong and Jeff Offutt},
title = {Applying Mutation Testing to Web Applications},
booktitle = {Third International Conference on Software Testing, Verification and Validation, {ICST} 2010, Paris, France, April 7-9, 2010, Workshops Proceedings},
year = {2010},
address = {},
month = {},
pages = {132--141}
} |
| 3 | Upsorn Praphamontripong and A. Jefferson Offutt
Applying Mutation Testing to Web Applications
Proceedings of the 5th International Workshop on Mutation Analysis (MUTATION'10)Paris, France, 6 April 2010. |
|
| | Abstract: Available soon... |
| | @INPROCEEDINGS{PraphamotripongO10,
author = {Upsorn Praphamontripong and A. Jefferson Offutt},
title = {Applying Mutation Testing to Web Applications},
booktitle = {Proceedings of the 5th International Workshop on Mutation Analysis (MUTATION'10)},
year = {2010},
address = {Paris, France},
month = {6 April},
pages = {}
} |
| 4 | Nan Li and Upsorn Praphamontripong and Jeff Offutt
An Experimental Comparison of Four Unit Test Criteria: Mutation, Edge-Pair, All-Uses and Prime Path Coverage
Second International Conference on Software Testing Verification and Validation, {ICST} 2009, Denver, Colorado, USA, April 1-4, 2009, Workshops Proceedings, 2009. |
|
| | Abstract: Available soon... |
| | @INPROCEEDINGS{LiPO09,
author = {Nan Li and Upsorn Praphamontripong and Jeff Offutt},
title = {An Experimental Comparison of Four Unit Test Criteria: Mutation, Edge-Pair, All-Uses and Prime Path Coverage},
booktitle = {Second International Conference on Software Testing Verification and Validation, {ICST} 2009, Denver, Colorado, USA, April 1-4, 2009, Workshops Proceedings},
year = {2009},
address = {},
month = {},
pages = {220--229}
} |
| 5 | Nan Li and Upsorn Praphamontripong and A. Jefferson Offutt
An Experimental Comparison of Four Unit Test Criteria: Mutation, Edge-Pair, All-uses and Prime Path Coverage
Proceedings of the 4th International Workshop on Mutation Analysis (MUTATION'09)Denver, Colorado, 1-4 April 2009. |
|
| | Abstract: With recent increased expectations for quality, and the growth of agile processes and test driven development, developers are expected to do more and more effective unittesting. Yet, our knowledge of when to use the variousunit level test criteria is incomplete. The paper presentsresults from a comparison of four unit level software testing criteria. Mutation testing, prime path coverage, edgepair coverage, and all-uses testing were compared on twobases: the number of seeded faults found and the numberof tests needed to satisfy the criteria. The comparisonused a collection of Java classes taken from varioussources and hand-seeded faults. Tests were designed andgenerated mostly by hand with help from tools that computetest requirements and muJava. The findings are that mutationtests detected more faults and the other three criteriawere very similar. The paper also presents a secondarymeasure, a cost benefit ratio, computed as the number oftests needed to detect each fault. Surprisingly, mutation required the fewest number of tests. The paper also discusses some specific faults that were not found and presents analysis for why not. |
| | @INPROCEEDINGS{LiPO09,
author = {Nan Li and Upsorn Praphamontripong and A. Jefferson Offutt},
title = {An Experimental Comparison of Four Unit Test Criteria: Mutation, Edge-Pair, All-uses and Prime Path Coverage},
booktitle = {Proceedings of the 4th International Workshop on Mutation Analysis (MUTATION'09)},
year = {2009},
address = {Denver, Colorado},
month = {1-4 April},
pages = {220-229}
} |
